id	sid	tid	token	lemma	pos
xw42n586g72	1	1	significant	significant	ADJ
xw42n586g72	1	2	attention	attention	NOUN
xw42n586g72	1	3	has	have	AUX
xw42n586g72	1	4	been	be	AUX
xw42n586g72	1	5	given	give	VERB
xw42n586g72	1	6	to	to	ADP
xw42n586g72	1	7	the	the	DET
xw42n586g72	1	8	so	so	ADV
xw42n586g72	1	9	-	-	PUNCT
xw42n586g72	1	10	called	call	VERB
xw42n586g72	1	11	'	'	PUNCT
xw42n586g72	1	12	blinking	blink	VERB
xw42n586g72	1	13	dot	dot	NOUN
xw42n586g72	1	14	'	'	PUNCT
xw42n586g72	1	15	phenomenon	phenomenon	NOUN
xw42n586g72	1	16	,	,	PUNCT
xw42n586g72	1	17	which	which	PRON
xw42n586g72	1	18	describes	describe	VERB
xw42n586g72	1	19	the	the	DET
xw42n586g72	1	20	fluorescence	fluorescence	ADJ
xw42n586g72	1	21	intermittency	intermittency	NOUN
xw42n586g72	1	22	exhibited	exhibit	VERB
xw42n586g72	1	23	by	by	ADP
xw42n586g72	1	24	a	a	DET
xw42n586g72	1	25	wide	wide	ADJ
xw42n586g72	1	26	variety	variety	NOUN
xw42n586g72	1	27	of	of	ADP
xw42n586g72	1	28	nanoscale	nanoscale	ADJ
xw42n586g72	1	29	objects	object	NOUN
xw42n586g72	1	30	such	such	ADJ
xw42n586g72	1	31	as	as	ADP
xw42n586g72	1	32	quantum	quantum	NOUN
xw42n586g72	1	33	dots	dot	NOUN
xw42n586g72	1	34	,	,	PUNCT
xw42n586g72	1	35	and	and	CCONJ
xw42n586g72	1	36	nanowires	nanowire	NOUN
xw42n586g72	1	37	.	.	PUNCT
xw42n586g72	2	1	it	it	PRON
xw42n586g72	2	2	is	be	AUX
xw42n586g72	2	3	believed	believe	VERB
xw42n586g72	2	4	that	that	SCONJ
xw42n586g72	2	5	blinking	blink	VERB
xw42n586g72	2	6	is	be	AUX
xw42n586g72	2	7	associated	associate	VERB
xw42n586g72	2	8	with	with	ADP
xw42n586g72	2	9	spatial	spatial	ADJ
xw42n586g72	2	10	charge	charge	NOUN
xw42n586g72	2	11	redistribution	redistribution	NOUN
xw42n586g72	2	12	within	within	ADP
xw42n586g72	2	13	the	the	DET
xw42n586g72	2	14	nanoscale	nanoscale	NOUN
xw42n586g72	2	15	blinking	blink	VERB
xw42n586g72	2	16	objects	object	NOUN
xw42n586g72	2	17	.	.	PUNCT
xw42n586g72	3	1	the	the	DET
xw42n586g72	3	2	natural	natural	ADJ
xw42n586g72	3	3	choice	choice	NOUN
xw42n586g72	3	4	to	to	PART
xw42n586g72	3	5	detect	detect	VERB
xw42n586g72	3	6	these	these	DET
xw42n586g72	3	7	charge	charge	NOUN
xw42n586g72	3	8	fluctuations	fluctuation	NOUN
xw42n586g72	3	9	is	be	AUX
xw42n586g72	3	10	single	single	ADJ
xw42n586g72	3	11	-	-	PUNCT
xw42n586g72	3	12	electron	electron	NOUN
xw42n586g72	3	13	transistors	transistor	NOUN
xw42n586g72	3	14	(	(	PUNCT
xw42n586g72	3	15	sets	set	NOUN
xw42n586g72	3	16	)	)	PUNCT
xw42n586g72	3	17	.	.	PUNCT
xw42n586g72	4	1	evidently	evidently	ADV
xw42n586g72	4	2	,	,	PUNCT
xw42n586g72	4	3	the	the	DET
xw42n586g72	4	4	electrometers	electrometer	NOUN
xw42n586g72	4	5	used	use	VERB
xw42n586g72	4	6	for	for	ADP
xw42n586g72	4	7	this	this	DET
xw42n586g72	4	8	measurement	measurement	NOUN
xw42n586g72	4	9	should	should	AUX
xw42n586g72	4	10	not	not	PART
xw42n586g72	4	11	be	be	AUX
xw42n586g72	4	12	affected	affect	VERB
xw42n586g72	4	13	by	by	ADP
xw42n586g72	4	14	light	light	ADJ
xw42n586g72	4	15	illumination	illumination	NOUN
xw42n586g72	4	16	.	.	PUNCT
xw42n586g72	5	1	we	we	PRON
xw42n586g72	5	2	studied	study	VERB
xw42n586g72	5	3	the	the	DET
xw42n586g72	5	4	effects	effect	NOUN
xw42n586g72	5	5	of	of	ADP
xw42n586g72	5	6	light	light	ADJ
xw42n586g72	5	7	illumination	illumination	NOUN
xw42n586g72	5	8	,	,	PUNCT
xw42n586g72	5	9	from	from	ADP
xw42n586g72	5	10	near	near	ADP
xw42n586g72	5	11	infrared	infrared	ADJ
xw42n586g72	5	12	to	to	ADP
xw42n586g72	5	13	blue	blue	ADJ
xw42n586g72	5	14	,	,	PUNCT
xw42n586g72	5	15	on	on	ADP
xw42n586g72	5	16	the	the	DET
xw42n586g72	5	17	characteristics	characteristic	NOUN
xw42n586g72	5	18	of	of	ADP
xw42n586g72	5	19	al	al	PROPN
xw42n586g72	5	20	/	/	SYM
xw42n586g72	5	21	alox	alox	NOUN
xw42n586g72	5	22	sets	set	NOUN
xw42n586g72	5	23	at	at	ADP
xw42n586g72	5	24	low	low	ADJ
xw42n586g72	5	25	temperatures	temperature	NOUN
xw42n586g72	5	26	(	(	PUNCT
xw42n586g72	5	27	0.3	0.3	NUM
xw42n586g72	5	28	ì¢	ì¢	NUM
xw42n586g72	5	29	ââ	ââ	NOUN
xw42n586g72	5	30	'	'	PART
xw42n586g72	5	31	4.2k	4.2k	NUM
xw42n586g72	5	32	)	)	PUNCT
xw42n586g72	5	33	.	.	PUNCT
xw42n586g72	6	1	based	base	VERB
xw42n586g72	6	2	on	on	ADP
xw42n586g72	6	3	the	the	DET
xw42n586g72	6	4	results	result	NOUN
xw42n586g72	6	5	of	of	ADP
xw42n586g72	6	6	this	this	DET
xw42n586g72	6	7	study	study	NOUN
xw42n586g72	6	8	,	,	PUNCT
xw42n586g72	6	9	we	we	PRON
xw42n586g72	6	10	developed	develop	VERB
xw42n586g72	6	11	a	a	DET
xw42n586g72	6	12	fabrication	fabrication	NOUN
xw42n586g72	6	13	processes	process	NOUN
xw42n586g72	6	14	for	for	ADP
xw42n586g72	6	15	producing	produce	VERB
xw42n586g72	6	16	sets	set	NOUN
xw42n586g72	6	17	on	on	ADP
xw42n586g72	6	18	wide	wide	ADJ
xw42n586g72	6	19	bandgap	bandgap	NOUN
xw42n586g72	6	20	insulating	insulate	VERB
xw42n586g72	6	21	substrates	substrate	NOUN
xw42n586g72	6	22	(	(	PUNCT
xw42n586g72	6	23	quartz	quartz	NOUN
xw42n586g72	6	24	and	and	CCONJ
xw42n586g72	6	25	sapphire	sapphire	NOUN
xw42n586g72	6	26	)	)	PUNCT
xw42n586g72	6	27	,	,	PUNCT
xw42n586g72	6	28	and	and	CCONJ
xw42n586g72	6	29	the	the	DET
xw42n586g72	6	30	fabrication	fabrication	NOUN
xw42n586g72	6	31	of	of	ADP
xw42n586g72	6	32	metal	metal	NOUN
xw42n586g72	6	33	shields	shield	NOUN
xw42n586g72	6	34	on	on	ADP
xw42n586g72	6	35	top	top	NOUN
xw42n586g72	6	36	of	of	ADP
xw42n586g72	6	37	the	the	DET
xw42n586g72	6	38	set	set	NOUN
xw42n586g72	6	39	devices	device	NOUN
xw42n586g72	6	40	(	(	PUNCT
xw42n586g72	6	41	which	which	PRON
xw42n586g72	6	42	demonstrates	demonstrate	VERB
xw42n586g72	6	43	the	the	DET
xw42n586g72	6	44	possibility	possibility	NOUN
xw42n586g72	6	45	of	of	ADP
xw42n586g72	6	46	post	post	ADJ
xw42n586g72	6	47	-	-	ADJ
xw42n586g72	6	48	processing	processing	NOUN
xw42n586g72	6	49	of	of	ADP
xw42n586g72	6	50	sets	set	NOUN
xw42n586g72	6	51	)	)	PUNCT
xw42n586g72	6	52	.	.	PUNCT
xw42n586g72	7	1	among	among	ADP
xw42n586g72	7	2	the	the	DET
xw42n586g72	7	3	most	most	ADV
xw42n586g72	7	4	important	important	ADJ
xw42n586g72	7	5	outcomes	outcome	NOUN
xw42n586g72	7	6	of	of	ADP
xw42n586g72	7	7	this	this	DET
xw42n586g72	7	8	study	study	NOUN
xw42n586g72	7	9	is	be	AUX
xw42n586g72	7	10	the	the	DET
xw42n586g72	7	11	realization	realization	NOUN
xw42n586g72	7	12	of	of	ADP
xw42n586g72	7	13	the	the	DET
xw42n586g72	7	14	significant	significant	ADJ
xw42n586g72	7	15	influence	influence	NOUN
xw42n586g72	7	16	that	that	SCONJ
xw42n586g72	7	17	the	the	DET
xw42n586g72	7	18	substrate	substrate	NOUN
xw42n586g72	7	19	material	material	NOUN
xw42n586g72	7	20	has	have	VERB
xw42n586g72	7	21	on	on	ADP
xw42n586g72	7	22	set	set	ADJ
xw42n586g72	7	23	devices	device	NOUN
xw42n586g72	7	24	.	.	PUNCT
xw42n586g72	8	1	these	these	DET
xw42n586g72	8	2	results	result	NOUN
xw42n586g72	8	3	led	lead	VERB
xw42n586g72	8	4	us	we	PRON
xw42n586g72	8	5	to	to	PART
xw42n586g72	8	6	further	far	ADV
xw42n586g72	8	7	study	study	VERB
xw42n586g72	8	8	the	the	DET
xw42n586g72	8	9	characteristics	characteristic	NOUN
xw42n586g72	8	10	of	of	ADP
xw42n586g72	8	11	the	the	DET
xw42n586g72	8	12	charge	charge	NOUN
xw42n586g72	8	13	traps	trap	NOUN
xw42n586g72	8	14	and	and	CCONJ
xw42n586g72	8	15	investigate	investigate	VERB
xw42n586g72	8	16	the	the	DET
xw42n586g72	8	17	causes	cause	NOUN
xw42n586g72	8	18	of	of	ADP
xw42n586g72	8	19	background	background	NOUN
xw42n586g72	8	20	charge	charge	NOUN
xw42n586g72	8	21	in	in	ADP
xw42n586g72	8	22	sets	set	NOUN
xw42n586g72	8	23	.	.	PUNCT
xw42n586g72	9	1	in	in	ADP
xw42n586g72	9	2	addition	addition	NOUN
xw42n586g72	9	3	,	,	PUNCT
xw42n586g72	9	4	we	we	PRON
xw42n586g72	9	5	developed	develop	VERB
xw42n586g72	9	6	a	a	DET
xw42n586g72	9	7	fabrication	fabrication	NOUN
xw42n586g72	9	8	method	method	NOUN
xw42n586g72	9	9	for	for	ADP
xw42n586g72	9	10	producing	produce	VERB
xw42n586g72	9	11	metallic	metallic	ADJ
xw42n586g72	9	12	sets	set	NOUN
xw42n586g72	9	13	with	with	ADP
xw42n586g72	9	14	tunnel	tunnel	NOUN
xw42n586g72	9	15	barriers	barrier	NOUN
xw42n586g72	9	16	made	make	VERB
xw42n586g72	9	17	by	by	ADP
xw42n586g72	9	18	atomic	atomic	ADJ
xw42n586g72	9	19	layer	layer	NOUN
xw42n586g72	9	20	deposition	deposition	NOUN
xw42n586g72	9	21	.	.	PUNCT
xw42n586g72	10	1	this	this	PRON
xw42n586g72	10	2	provides	provide	VERB
xw42n586g72	10	3	tunnel	tunnel	NOUN
xw42n586g72	10	4	barriers	barrier	NOUN
xw42n586g72	10	5	with	with	ADP
xw42n586g72	10	6	higher	high	ADJ
xw42n586g72	10	7	quality	quality	NOUN
xw42n586g72	10	8	and	and	CCONJ
xw42n586g72	10	9	holds	hold	VERB
xw42n586g72	10	10	the	the	DET
xw42n586g72	10	11	promises	promise	NOUN
xw42n586g72	10	12	of	of	ADP
xw42n586g72	10	13	a	a	DET
xw42n586g72	10	14	reduction	reduction	NOUN
xw42n586g72	10	15	of	of	ADP
xw42n586g72	10	16	individual	individual	ADJ
xw42n586g72	10	17	trap	trap	NOUN
xw42n586g72	10	18	effects	effect	NOUN
xw42n586g72	10	19	related	relate	VERB
xw42n586g72	10	20	to	to	ADP
xw42n586g72	10	21	disordered	disordered	NOUN
xw42n586g72	10	22	materials	material	NOUN
xw42n586g72	10	23	surrounding	surround	VERB
xw42n586g72	10	24	the	the	DET
xw42n586g72	10	25	set	set	NOUN
xw42n586g72	10	26	's	's	PART
xw42n586g72	10	27	island	island	NOUN
xw42n586g72	10	28	and	and	CCONJ
xw42n586g72	10	29	leads	lead	VERB
xw42n586g72	10	30	(	(	PUNCT
xw42n586g72	10	31	source	source	NOUN
xw42n586g72	10	32	/	/	SYM
xw42n586g72	10	33	drain	drain	NOUN
xw42n586g72	10	34	)	)	PUNCT
xw42n586g72	10	35	.	.	PUNCT