id	sid	tid	token	lemma	pos
cf95j96258t	1	1	we	we	PRON
cf95j96258t	1	2	report	report	VERB
cf95j96258t	1	3	the	the	DET
cf95j96258t	1	4	fabrication	fabrication	NOUN
cf95j96258t	1	5	and	and	CCONJ
cf95j96258t	1	6	characterization	characterization	NOUN
cf95j96258t	1	7	of	of	ADP
cf95j96258t	1	8	single	single	ADJ
cf95j96258t	1	9	and	and	CCONJ
cf95j96258t	1	10	network	network	NOUN
cf95j96258t	1	11	of	of	ADP
cf95j96258t	1	12	cdse	cdse	PROPN
cf95j96258t	1	13	nanowire	nanowire	PROPN
cf95j96258t	1	14	(	(	PUNCT
cf95j96258t	1	15	nw	nw	PROPN
cf95j96258t	1	16	)	)	PUNCT
cf95j96258t	1	17	field	field	NOUN
cf95j96258t	1	18	-	-	PUNCT
cf95j96258t	1	19	effect	effect	NOUN
cf95j96258t	1	20	transistors	transistor	NOUN
cf95j96258t	1	21	(	(	PUNCT
cf95j96258t	1	22	fets	fet	NOUN
cf95j96258t	1	23	)	)	PUNCT
cf95j96258t	1	24	.	.	PUNCT
cf95j96258t	2	1	the	the	DET
cf95j96258t	2	2	nws	nws	NOUN
cf95j96258t	2	3	are	be	AUX
cf95j96258t	2	4	grown	grow	VERB
cf95j96258t	2	5	by	by	ADP
cf95j96258t	2	6	the	the	DET
cf95j96258t	2	7	solution	solution	NOUN
cf95j96258t	2	8	-	-	PUNCT
cf95j96258t	2	9	liquid	liquid	NOUN
cf95j96258t	2	10	-	-	PUNCT
cf95j96258t	2	11	solid	solid	ADJ
cf95j96258t	2	12	(	(	PUNCT
cf95j96258t	2	13	sls	sls	NOUN
cf95j96258t	2	14	)	)	PUNCT
cf95j96258t	2	15	technique	technique	NOUN
cf95j96258t	2	16	and	and	CCONJ
cf95j96258t	2	17	are	be	AUX
cf95j96258t	2	18	on	on	ADP
cf95j96258t	2	19	an	an	DET
cf95j96258t	2	20	average	average	ADJ
cf95j96258t	2	21	10	10	NUM
cf95j96258t	2	22	nms	nms	NOUN
cf95j96258t	2	23	in	in	ADP
cf95j96258t	2	24	diameter	diameter	NOUN
cf95j96258t	2	25	and	and	CCONJ
cf95j96258t	2	26	few	few	ADJ
cf95j96258t	2	27	microns	micron	NOUN
cf95j96258t	2	28	in	in	ADP
cf95j96258t	2	29	length.back	length.back	NOUN
cf95j96258t	2	30	gating	gating	NOUN
cf95j96258t	2	31	is	be	AUX
cf95j96258t	2	32	employed	employ	VERB
cf95j96258t	2	33	to	to	PART
cf95j96258t	2	34	fabricate	fabricate	VERB
cf95j96258t	2	35	fets	fet	NOUN
cf95j96258t	2	36	.	.	PUNCT
cf95j96258t	3	1	electrical	electrical	ADJ
cf95j96258t	3	2	contacts	contact	NOUN
cf95j96258t	3	3	are	be	AUX
cf95j96258t	3	4	defined	define	VERB
cf95j96258t	3	5	to	to	ADP
cf95j96258t	3	6	network	network	NOUN
cf95j96258t	3	7	of	of	ADP
cf95j96258t	3	8	nws	nws	NOUN
cf95j96258t	3	9	by	by	ADP
cf95j96258t	3	10	photolithography	photolithography	NOUN
cf95j96258t	3	11	while	while	SCONJ
cf95j96258t	3	12	e	e	NOUN
cf95j96258t	3	13	-	-	NOUN
cf95j96258t	3	14	beam	beam	ADJ
cf95j96258t	3	15	lithography	lithography	NOUN
cf95j96258t	3	16	(	(	PUNCT
cf95j96258t	3	17	ebl	ebl	PROPN
cf95j96258t	3	18	)	)	PUNCT
cf95j96258t	3	19	and	and	CCONJ
cf95j96258t	3	20	focussed	focusse	VERB
cf95j96258t	3	21	ion	ion	NOUN
cf95j96258t	3	22	beam	beam	NOUN
cf95j96258t	3	23	(	(	PUNCT
cf95j96258t	3	24	fib	fib	NOUN
cf95j96258t	3	25	)	)	PUNCT
cf95j96258t	3	26	methods	method	NOUN
cf95j96258t	3	27	are	be	AUX
cf95j96258t	3	28	employedto	employedto	ADJ
cf95j96258t	3	29	contact	contact	NOUN
cf95j96258t	3	30	single	single	ADJ
cf95j96258t	3	31	nws	nws	NOUN
cf95j96258t	3	32	that	that	DET
cf95j96258t	3	33	act	act	NOUN
cf95j96258t	3	34	as	as	ADP
cf95j96258t	3	35	channels	channel	NOUN
cf95j96258t	3	36	of	of	ADP
cf95j96258t	3	37	the	the	DET
cf95j96258t	3	38	fets	fet	NOUN
cf95j96258t	3	39	.	.	PUNCT
cf95j96258t	4	1	fabrication	fabrication	NOUN
cf95j96258t	4	2	of	of	ADP
cf95j96258t	4	3	nw	nw	PROPN
cf95j96258t	4	4	fets	fets	PROPN
cf95j96258t	4	5	,	,	PUNCT
cf95j96258t	4	6	with	with	ADP
cf95j96258t	4	7	problems	problem	NOUN
cf95j96258t	4	8	encountered	encounter	VERB
cf95j96258t	4	9	and	and	CCONJ
cf95j96258t	4	10	possible	possible	ADJ
cf95j96258t	4	11	solutions	solution	NOUN
cf95j96258t	4	12	to	to	ADP
cf95j96258t	4	13	the	the	DET
cf95j96258t	4	14	problems	problem	NOUN
cf95j96258t	4	15	are	be	AUX
cf95j96258t	4	16	discussed	discuss	VERB
cf95j96258t	4	17	in	in	ADP
cf95j96258t	4	18	detail.individual	detail.individual	PROPN
cf95j96258t	4	19	cdse	cdse	PROPN
cf95j96258t	4	20	nws	nws	PROPN
cf95j96258t	4	21	are	be	AUX
cf95j96258t	4	22	found	find	VERB
cf95j96258t	4	23	to	to	PART
cf95j96258t	4	24	be	be	AUX
cf95j96258t	4	25	very	very	ADV
cf95j96258t	4	26	resistive	resistive	ADJ
cf95j96258t	4	27	with	with	ADP
cf95j96258t	4	28	current	current	ADJ
cf95j96258t	4	29	levels	level	NOUN
cf95j96258t	4	30	in	in	ADP
cf95j96258t	4	31	a	a	DET
cf95j96258t	4	32	few	few	ADJ
cf95j96258t	4	33	pas	pa	NOUN
cf95j96258t	4	34	for	for	ADP
cf95j96258t	4	35	few	few	ADJ
cf95j96258t	4	36	volts	volt	NOUN
cf95j96258t	4	37	of	of	ADP
cf95j96258t	4	38	applied	applied	ADJ
cf95j96258t	4	39	bias	bias	NOUN
cf95j96258t	4	40	.	.	PUNCT
cf95j96258t	5	1	pronounced	pronounce	VERB
cf95j96258t	5	2	photoconductivity	photoconductivity	NOUN
cf95j96258t	5	3	is	be	AUX
cf95j96258t	5	4	observed	observe	VERB
cf95j96258t	5	5	in	in	ADP
cf95j96258t	5	6	the	the	DET
cf95j96258t	5	7	presence	presence	NOUN
cf95j96258t	5	8	of	of	ADP
cf95j96258t	5	9	visible	visible	ADJ
cf95j96258t	5	10	lightwith	lightwith	ADJ
cf95j96258t	5	11	current	current	ADJ
cf95j96258t	5	12	levels	level	NOUN
cf95j96258t	5	13	increasing	increase	VERB
cf95j96258t	5	14	from	from	ADP
cf95j96258t	5	15	a	a	DET
cf95j96258t	5	16	few	few	ADJ
cf95j96258t	5	17	pas	pa	NOUN
cf95j96258t	5	18	to	to	ADP
cf95j96258t	5	19	100s	100s	PROPN
cf95j96258t	5	20	of	of	ADP
cf95j96258t	5	21	pas	pas	NOUN
cf95j96258t	5	22	for	for	ADP
cf95j96258t	5	23	single	single	ADJ
cf95j96258t	5	24	nws	nws	NOUN
cf95j96258t	5	25	and	and	CCONJ
cf95j96258t	5	26	a	a	DET
cf95j96258t	5	27	few	few	ADJ
cf95j96258t	5	28	nas	na	NOUN
cf95j96258t	5	29	to	to	ADP
cf95j96258t	5	30	few	few	ADJ
cf95j96258t	5	31	$	$	SYM
cf95j96258t	5	32	mu$as	mu$as	PROPN
cf95j96258t	5	33	for	for	ADP
cf95j96258t	5	34	network	network	NOUN
cf95j96258t	5	35	of	of	ADP
cf95j96258t	5	36	nws.field	nws.field	PROPN
cf95j96258t	5	37	effect	effect	PROPN
cf95j96258t	5	38	characterization	characterization	PROPN
cf95j96258t	5	39	indicates	indicate	VERB
cf95j96258t	5	40	n	n	ADJ
cf95j96258t	5	41	-	-	PUNCT
cf95j96258t	5	42	type	type	ADJ
cf95j96258t	5	43	unintentional	unintentional	ADJ
cf95j96258t	5	44	doping	doping	NOUN
cf95j96258t	5	45	of	of	ADP
cf95j96258t	5	46	cdse	cdse	PROPN
cf95j96258t	5	47	nws	nws	PROPN
cf95j96258t	5	48	.	.	PUNCT
cf95j96258t	6	1	in	in	ADP
cf95j96258t	6	2	dark	dark	ADJ
cf95j96258t	6	3	,	,	PUNCT
cf95j96258t	6	4	turn	turn	VERB
cf95j96258t	6	5	-	-	PUNCT
cf95j96258t	6	6	on	on	NOUN
cf95j96258t	6	7	to	to	PART
cf95j96258t	6	8	turn	turn	VERB
cf95j96258t	6	9	-	-	PUNCT
cf95j96258t	6	10	off	off	ADP
cf95j96258t	6	11	current	current	ADJ
cf95j96258t	6	12	ratios	ratio	NOUN
cf95j96258t	6	13	between	between	ADP
cf95j96258t	6	14	10	10	NUM
cf95j96258t	6	15	and	and	CCONJ
cf95j96258t	6	16	$	$	SYM
cf95j96258t	6	17	~$10$^{3}$	~$10$^{3}$	X
cf95j96258t	6	18	for	for	ADP
cf95j96258t	6	19	single	single	ADJ
cf95j96258t	6	20	nws	nws	NOUN
cf95j96258t	6	21	and	and	CCONJ
cf95j96258t	6	22	between	between	ADP
cf95j96258t	6	23	10$^{3}$	10$^{3}$	NUM
cf95j96258t	6	24	and	and	CCONJ
cf95j96258t	6	25	10$^{6}$	10$^{6}$	NUM
cf95j96258t	6	26	for	for	ADP
cf95j96258t	6	27	network	network	NOUN
cf95j96258t	6	28	of	of	ADP
cf95j96258t	6	29	nws	nws	PROPN
cf95j96258t	6	30	fets	fet	NOUN
cf95j96258t	6	31	have	have	AUX
cf95j96258t	6	32	been	be	AUX
cf95j96258t	6	33	realized.under	realized.under	NOUN
cf95j96258t	6	34	optical	optical	ADJ
cf95j96258t	6	35	illumination	illumination	NOUN
cf95j96258t	6	36	,	,	PUNCT
cf95j96258t	6	37	current	current	ADJ
cf95j96258t	6	38	increment	increment	NOUN
cf95j96258t	6	39	from	from	ADP
cf95j96258t	6	40	over	over	ADP
cf95j96258t	6	41	10	10	NUM
cf95j96258t	6	42	to	to	ADP
cf95j96258t	6	43	10$^{3}$	10$^{3}$	NUM
cf95j96258t	6	44	as	as	SCONJ
cf95j96258t	6	45	gate	gate	NOUN
cf95j96258t	6	46	bias	bias	NOUN
cf95j96258t	6	47	is	be	AUX
cf95j96258t	6	48	changed	change	VERB
cf95j96258t	6	49	from	from	ADP
cf95j96258t	6	50	+40v	+40v	PROPN
cf95j96258t	6	51	to	to	PART
cf95j96258t	6	52	-30v	-30v	PROPN
cf95j96258t	6	53	is	be	AUX
cf95j96258t	6	54	observed	observe	VERB
cf95j96258t	6	55	for	for	ADP
cf95j96258t	6	56	single	single	ADJ
cf95j96258t	6	57	nw	nw	PROPN
cf95j96258t	6	58	fets	fet	NOUN
cf95j96258t	6	59	while	while	SCONJ
cf95j96258t	6	60	current	current	ADJ
cf95j96258t	6	61	increment	increment	NOUN
cf95j96258t	6	62	from	from	ADP
cf95j96258t	6	63	over	over	ADP
cf95j96258t	6	64	10	10	NUM
cf95j96258t	6	65	to	to	ADP
cf95j96258t	6	66	10$^{6}$	10$^{6}$	NUM
cf95j96258t	6	67	isobserved	isobserve	VERB
cf95j96258t	6	68	for	for	ADP
cf95j96258t	6	69	network	network	NOUN
cf95j96258t	6	70	of	of	ADP
cf95j96258t	6	71	nws	nws	ADJ
cf95j96258t	6	72	fets	fet	NOUN
cf95j96258t	6	73	as	as	SCONJ
cf95j96258t	6	74	gate	gate	NOUN
cf95j96258t	6	75	bias	bias	NOUN
cf95j96258t	6	76	varies	vary	VERB
cf95j96258t	6	77	from	from	ADP
cf95j96258t	6	78	+10v	+10v	NUM
cf95j96258t	6	79	to	to	ADP
cf95j96258t	6	80	-10v	-10v	PROPN
cf95j96258t	6	81	.	.	PUNCT
cf95j96258t	7	1	loss	loss	NOUN
cf95j96258t	7	2	of	of	ADP
cf95j96258t	7	3	gate	gate	NOUN
cf95j96258t	7	4	control	control	NOUN
cf95j96258t	7	5	under	under	ADP
cf95j96258t	7	6	optical	optical	ADJ
cf95j96258t	7	7	illumination	illumination	NOUN
cf95j96258t	7	8	is	be	AUX
cf95j96258t	7	9	observedfor	observedfor	PROPN
cf95j96258t	7	10	both	both	CCONJ
cf95j96258t	7	11	single	single	ADJ
cf95j96258t	7	12	and	and	CCONJ
cf95j96258t	7	13	network	network	NOUN
cf95j96258t	7	14	of	of	ADP
cf95j96258t	7	15	nws.our	nws.our	PROPN
cf95j96258t	7	16	nw	nw	PROPN
cf95j96258t	7	17	fets	fets	PROPN
cf95j96258t	7	18	show	show	VERB
cf95j96258t	7	19	high	high	ADJ
cf95j96258t	7	20	photoconductivity	photoconductivity	NOUN
cf95j96258t	7	21	which	which	PRON
cf95j96258t	7	22	makes	make	VERB
cf95j96258t	7	23	them	they	PRON
cf95j96258t	7	24	suitable	suitable	ADJ
cf95j96258t	7	25	for	for	ADP
cf95j96258t	7	26	nw	nw	PROPN
cf95j96258t	7	27	based	base	VERB
cf95j96258t	7	28	optical	optical	ADJ
cf95j96258t	7	29	sensing	sensing	NOUN
cf95j96258t	7	30	.	.	PUNCT