id	sid	tid	token	lemma	pos
bc386h4755t	1	1	the	the	DET
bc386h4755t	1	2	dynamics	dynamic	NOUN
bc386h4755t	1	3	of	of	ADP
bc386h4755t	1	4	reading	read	VERB
bc386h4755t	1	5	and	and	CCONJ
bc386h4755t	1	6	writing	write	VERB
bc386h4755t	1	7	the	the	DET
bc386h4755t	1	8	partial	partial	ADJ
bc386h4755t	1	9	polarization	polarization	NOUN
bc386h4755t	1	10	state	state	NOUN
bc386h4755t	1	11	in	in	ADP
bc386h4755t	1	12	ferroelectric	ferroelectric	ADJ
bc386h4755t	1	13	(	(	PUNCT
bc386h4755t	1	14	fe	fe	PROPN
bc386h4755t	1	15	)	)	PUNCT
bc386h4755t	1	16	capacitors	capacitor	NOUN
bc386h4755t	1	17	have	have	AUX
bc386h4755t	1	18	been	be	AUX
bc386h4755t	1	19	explored	explore	VERB
bc386h4755t	1	20	for	for	ADP
bc386h4755t	1	21	use	use	NOUN
bc386h4755t	1	22	in	in	ADP
bc386h4755t	1	23	nonvolatile	nonvolatile	ADJ
bc386h4755t	1	24	analog	analog	NOUN
bc386h4755t	1	25	memory	memory	NOUN
bc386h4755t	1	26	for	for	ADP
bc386h4755t	1	27	application	application	NOUN
bc386h4755t	1	28	in	in	ADP
bc386h4755t	1	29	training	train	VERB
bc386h4755t	1	30	neural	neural	ADJ
bc386h4755t	1	31	networks	network	NOUN
bc386h4755t	1	32	.	.	PUNCT
bc386h4755t	2	1	new	new	ADJ
bc386h4755t	2	2	pulse	pulse	NOUN
bc386h4755t	2	3	measurement	measurement	NOUN
bc386h4755t	2	4	protocols	protocol	NOUN
bc386h4755t	2	5	that	that	PRON
bc386h4755t	2	6	minimize	minimize	VERB
bc386h4755t	2	7	spurious	spurious	ADJ
bc386h4755t	2	8	interface	interface	NOUN
bc386h4755t	2	9	charging	charge	VERB
bc386h4755t	2	10	effects	effect	NOUN
bc386h4755t	2	11	have	have	AUX
bc386h4755t	2	12	been	be	AUX
bc386h4755t	2	13	developed	develop	VERB
bc386h4755t	2	14	to	to	ADP
bc386h4755t	2	15	more	more	ADV
bc386h4755t	2	16	precisely	precisely	ADV
bc386h4755t	2	17	measure	measure	NOUN
bc386h4755t	2	18	polarization	polarization	NOUN
bc386h4755t	2	19	,	,	PUNCT
bc386h4755t	2	20	polarization	polarization	NOUN
bc386h4755t	2	21	reversal	reversal	NOUN
bc386h4755t	2	22	,	,	PUNCT
bc386h4755t	2	23	and	and	CCONJ
bc386h4755t	2	24	current	current	ADJ
bc386h4755t	2	25	-	-	PUNCT
bc386h4755t	2	26	voltage	voltage	NOUN
bc386h4755t	2	27	characteristics	characteristic	NOUN
bc386h4755t	2	28	.	.	PUNCT
bc386h4755t	3	1	analytic	analytic	ADJ
bc386h4755t	3	2	methods	method	NOUN
bc386h4755t	3	3	to	to	PART
bc386h4755t	3	4	interpret	interpret	VERB
bc386h4755t	3	5	these	these	DET
bc386h4755t	3	6	measurements	measurement	NOUN
bc386h4755t	3	7	have	have	AUX
bc386h4755t	3	8	also	also	ADV
bc386h4755t	3	9	been	be	AUX
bc386h4755t	3	10	developed.a	developed.a	VERB
bc386h4755t	3	11	strictly	strictly	ADV
bc386h4755t	3	12	symmetric	symmetric	ADJ
bc386h4755t	3	13	pulse	pulse	NOUN
bc386h4755t	3	14	protocol	protocol	PROPN
bc386h4755t	3	15	,	,	PUNCT
bc386h4755t	3	16	where	where	SCONJ
bc386h4755t	3	17	the	the	DET
bc386h4755t	3	18	integral	integral	NOUN
bc386h4755t	3	19	of	of	ADP
bc386h4755t	3	20	the	the	DET
bc386h4755t	3	21	measurement	measurement	NOUN
bc386h4755t	3	22	waveform	waveform	NOUN
bc386h4755t	3	23	over	over	ADP
bc386h4755t	3	24	a	a	DET
bc386h4755t	3	25	measurement	measurement	NOUN
bc386h4755t	3	26	cycle	cycle	NOUN
bc386h4755t	3	27	is	be	AUX
bc386h4755t	3	28	zero	zero	NUM
bc386h4755t	3	29	,	,	PUNCT
bc386h4755t	3	30	was	be	AUX
bc386h4755t	3	31	developed	develop	VERB
bc386h4755t	3	32	to	to	PART
bc386h4755t	3	33	measure	measure	VERB
bc386h4755t	3	34	dynamic	dynamic	ADJ
bc386h4755t	3	35	effects	effect	NOUN
bc386h4755t	3	36	in	in	ADP
bc386h4755t	3	37	fe	fe	PROPN
bc386h4755t	3	38	capacitors	capacitor	NOUN
bc386h4755t	3	39	.	.	PUNCT
bc386h4755t	4	1	in	in	ADP
bc386h4755t	4	2	this	this	DET
bc386h4755t	4	3	way	way	NOUN
bc386h4755t	4	4	,	,	PUNCT
bc386h4755t	4	5	the	the	DET
bc386h4755t	4	6	effects	effect	NOUN
bc386h4755t	4	7	of	of	ADP
bc386h4755t	4	8	biasing	biasing	NOUN
bc386h4755t	4	9	were	be	AUX
bc386h4755t	4	10	balanced	balance	VERB
bc386h4755t	4	11	equally	equally	ADV
bc386h4755t	4	12	to	to	PART
bc386h4755t	4	13	minimize	minimize	VERB
bc386h4755t	4	14	charging	charge	VERB
bc386h4755t	4	15	of	of	ADP
bc386h4755t	4	16	the	the	DET
bc386h4755t	4	17	interfaces	interface	NOUN
bc386h4755t	4	18	.	.	PUNCT
bc386h4755t	5	1	unsaturated	unsaturated	ADJ
bc386h4755t	5	2	polarization	polarization	NOUN
bc386h4755t	5	3	reversal	reversal	NOUN
bc386h4755t	5	4	was	be	AUX
bc386h4755t	5	5	observed	observe	VERB
bc386h4755t	5	6	in	in	ADP
bc386h4755t	5	7	tin	tin	PROPN
bc386h4755t	5	8	/	/	SYM
bc386h4755t	5	9	hzo	hzo	PROPN
bc386h4755t	5	10	/	/	SYM
bc386h4755t	5	11	tin	tin	NOUN
bc386h4755t	5	12	capacitors	capacitor	NOUN
bc386h4755t	5	13	with	with	ADP
bc386h4755t	5	14	asymmetric	asymmetric	ADJ
bc386h4755t	5	15	measurements	measurement	NOUN
bc386h4755t	5	16	;	;	PUNCT
bc386h4755t	5	17	the	the	DET
bc386h4755t	5	18	unsaturation	unsaturation	NOUN
bc386h4755t	5	19	was	be	AUX
bc386h4755t	5	20	substantially	substantially	ADV
bc386h4755t	5	21	eliminated	eliminate	VERB
bc386h4755t	5	22	using	use	VERB
bc386h4755t	5	23	the	the	DET
bc386h4755t	5	24	strictly	strictly	ADV
bc386h4755t	5	25	symmetric	symmetric	ADJ
bc386h4755t	5	26	protocol.using	protocol.use	VERB
bc386h4755t	5	27	the	the	DET
bc386h4755t	5	28	strictly	strictly	ADV
bc386h4755t	5	29	symmetric	symmetric	ADJ
bc386h4755t	5	30	measurement	measurement	NOUN
bc386h4755t	5	31	protocol	protocol	NOUN
bc386h4755t	5	32	,	,	PUNCT
bc386h4755t	5	33	partial	partial	ADJ
bc386h4755t	5	34	polarization	polarization	NOUN
bc386h4755t	5	35	in	in	ADP
bc386h4755t	5	36	metal	metal	NOUN
bc386h4755t	5	37	-	-	PUNCT
bc386h4755t	5	38	fe	fe	NOUN
bc386h4755t	5	39	-	-	PUNCT
bc386h4755t	5	40	metal	metal	NOUN
bc386h4755t	5	41	capacitors	capacitor	NOUN
bc386h4755t	5	42	was	be	AUX
bc386h4755t	5	43	shown	show	VERB
bc386h4755t	5	44	to	to	PART
bc386h4755t	5	45	be	be	AUX
bc386h4755t	5	46	stable	stable	ADJ
bc386h4755t	5	47	up	up	ADV
bc386h4755t	5	48	to	to	PART
bc386h4755t	5	49	250	250	NUM
bc386h4755t	5	50	ms	ms	PROPN
bc386h4755t	5	51	.	.	PROPN
bc386h4755t	5	52	a	a	DET
bc386h4755t	5	53	surprising	surprising	ADJ
bc386h4755t	5	54	dependence	dependence	NOUN
bc386h4755t	5	55	of	of	ADP
bc386h4755t	5	56	partial	partial	ADJ
bc386h4755t	5	57	polarization	polarization	NOUN
bc386h4755t	5	58	on	on	ADP
bc386h4755t	5	59	the	the	DET
bc386h4755t	5	60	delay	delay	NOUN
bc386h4755t	5	61	between	between	ADP
bc386h4755t	5	62	reset	reset	NOUN
bc386h4755t	5	63	and	and	CCONJ
bc386h4755t	5	64	write	write	VERB
bc386h4755t	5	65	pulses	pulse	NOUN
bc386h4755t	5	66	,	,	PUNCT
bc386h4755t	5	67	and	and	CCONJ
bc386h4755t	5	68	the	the	DET
bc386h4755t	5	69	reset	reset	ADJ
bc386h4755t	5	70	conditions	condition	NOUN
bc386h4755t	5	71	,	,	PUNCT
bc386h4755t	5	72	was	be	AUX
bc386h4755t	5	73	discovered	discover	VERB
bc386h4755t	5	74	,	,	PUNCT
bc386h4755t	5	75	with	with	ADP
bc386h4755t	5	76	the	the	DET
bc386h4755t	5	77	partial	partial	ADJ
bc386h4755t	5	78	polarization	polarization	NOUN
bc386h4755t	5	79	changing	change	VERB
bc386h4755t	5	80	by	by	ADP
bc386h4755t	5	81	50	50	NUM
bc386h4755t	5	82	%	%	NOUN
bc386h4755t	5	83	of	of	ADP
bc386h4755t	5	84	the	the	DET
bc386h4755t	5	85	fe	fe	ADJ
bc386h4755t	5	86	remanent	remanent	ADJ
bc386h4755t	5	87	polarization	polarization	NOUN
bc386h4755t	5	88	.	.	PUNCT
bc386h4755t	6	1	this	this	DET
bc386h4755t	6	2	delay	delay	NOUN
bc386h4755t	6	3	-	-	PUNCT
bc386h4755t	6	4	before	before	ADP
bc386h4755t	6	5	-	-	PUNCT
bc386h4755t	6	6	write	write	NOUN
bc386h4755t	6	7	dependence	dependence	NOUN
bc386h4755t	6	8	was	be	AUX
bc386h4755t	6	9	qualitatively	qualitatively	ADV
bc386h4755t	6	10	attributed	attribute	VERB
bc386h4755t	6	11	to	to	ADP
bc386h4755t	6	12	the	the	DET
bc386h4755t	6	13	dynamics	dynamic	NOUN
bc386h4755t	6	14	of	of	ADP
bc386h4755t	6	15	subcritical	subcritical	ADJ
bc386h4755t	6	16	nuclei	nucleus	NOUN
bc386h4755t	6	17	that	that	PRON
bc386h4755t	6	18	exist	exist	VERB
bc386h4755t	6	19	up	up	ADP
bc386h4755t	6	20	to	to	PART
bc386h4755t	6	21	1	1	NUM
bc386h4755t	6	22	s	s	VERB
bc386h4755t	6	23	in	in	ADP
bc386h4755t	6	24	hzo	hzo	PROPN
bc386h4755t	6	25	,	,	PUNCT
bc386h4755t	6	26	and	and	CCONJ
bc386h4755t	6	27	whose	whose	DET
bc386h4755t	6	28	size	size	NOUN
bc386h4755t	6	29	is	be	AUX
bc386h4755t	6	30	estimated	estimate	VERB
bc386h4755t	6	31	to	to	PART
bc386h4755t	6	32	be	be	AUX
bc386h4755t	6	33	less	less	ADJ
bc386h4755t	6	34	than	than	ADP
bc386h4755t	6	35	4x4x4	4x4x4	NUM
bc386h4755t	6	36	hzo	hzo	PROPN
bc386h4755t	6	37	unit	unit	NOUN
bc386h4755t	6	38	cells.a	cells.a	PROPN
bc386h4755t	7	1	strictly	strictly	ADV
bc386h4755t	7	2	symmetric	symmetric	ADJ
bc386h4755t	7	3	pulsed	pulse	VERB
bc386h4755t	7	4	protocol	protocol	NOUN
bc386h4755t	7	5	was	be	AUX
bc386h4755t	7	6	designed	design	VERB
bc386h4755t	7	7	for	for	ADP
bc386h4755t	7	8	current	current	ADJ
bc386h4755t	7	9	-	-	PUNCT
bc386h4755t	7	10	voltage	voltage	NOUN
bc386h4755t	7	11	-	-	PUNCT
bc386h4755t	7	12	time	time	NOUN
bc386h4755t	7	13	(	(	PUNCT
bc386h4755t	7	14	i	i	NOUN
bc386h4755t	7	15	-	-	PUNCT
bc386h4755t	7	16	v	v	NOUN
bc386h4755t	7	17	-	-	PUNCT
bc386h4755t	7	18	t	t	PROPN
bc386h4755t	7	19	)	)	PUNCT
bc386h4755t	7	20	measurements	measurement	NOUN
bc386h4755t	7	21	on	on	ADP
bc386h4755t	7	22	pd	pd	PROPN
bc386h4755t	7	23	/	/	SYM
bc386h4755t	7	24	hzo	hzo	PROPN
bc386h4755t	7	25	/	/	SYM
bc386h4755t	7	26	p+	p+	PROPN
bc386h4755t	7	27	si	si	X
bc386h4755t	7	28	capacitors	capacitor	NOUN
bc386h4755t	7	29	.	.	PUNCT
bc386h4755t	8	1	the	the	DET
bc386h4755t	8	2	i	i	PROPN
bc386h4755t	8	3	-	-	PUNCT
bc386h4755t	8	4	v	v	NOUN
bc386h4755t	8	5	-	-	PUNCT
bc386h4755t	8	6	t	t	NOUN
bc386h4755t	8	7	measurements	measurement	NOUN
bc386h4755t	8	8	showed	show	VERB
bc386h4755t	8	9	the	the	DET
bc386h4755t	8	10	capacitor	capacitor	NOUN
bc386h4755t	8	11	current	current	ADJ
bc386h4755t	8	12	direction	direction	NOUN
bc386h4755t	8	13	to	to	PART
bc386h4755t	8	14	be	be	AUX
bc386h4755t	8	15	opposite	opposite	ADJ
bc386h4755t	8	16	to	to	ADP
bc386h4755t	8	17	the	the	DET
bc386h4755t	8	18	applied	apply	VERB
bc386h4755t	8	19	bias	bias	NOUN
bc386h4755t	8	20	polarity	polarity	NOUN
bc386h4755t	8	21	for	for	ADP
bc386h4755t	8	22	voltages	voltage	NOUN
bc386h4755t	8	23	lower	low	ADJ
bc386h4755t	8	24	in	in	ADP
bc386h4755t	8	25	magnitude	magnitude	NOUN
bc386h4755t	8	26	than	than	ADP
bc386h4755t	8	27	certain	certain	ADJ
bc386h4755t	8	28	characteristic	characteristic	ADJ
bc386h4755t	8	29	zero	zero	NUM
bc386h4755t	8	30	crossing	cross	VERB
bc386h4755t	8	31	voltages	voltage	NOUN
bc386h4755t	8	32	.	.	PUNCT
bc386h4755t	9	1	the	the	DET
bc386h4755t	9	2	current	current	ADJ
bc386h4755t	9	3	magnitudes	magnitude	NOUN
bc386h4755t	9	4	increased	increase	VERB
bc386h4755t	9	5	when	when	SCONJ
bc386h4755t	9	6	the	the	DET
bc386h4755t	9	7	applied	apply	VERB
bc386h4755t	9	8	bias	bias	NOUN
bc386h4755t	9	9	magnitudes	magnitude	NOUN
bc386h4755t	9	10	were	be	AUX
bc386h4755t	9	11	decreased	decrease	VERB
bc386h4755t	9	12	further	far	ADV
bc386h4755t	9	13	.	.	PUNCT
bc386h4755t	10	1	a	a	DET
bc386h4755t	10	2	quantitative	quantitative	ADJ
bc386h4755t	10	3	analysis	analysis	NOUN
bc386h4755t	10	4	showed	show	VERB
bc386h4755t	10	5	these	these	DET
bc386h4755t	10	6	observations	observation	NOUN
bc386h4755t	10	7	to	to	PART
bc386h4755t	10	8	be	be	AUX
bc386h4755t	10	9	consistent	consistent	ADJ
bc386h4755t	10	10	with	with	ADP
bc386h4755t	10	11	the	the	DET
bc386h4755t	10	12	assumption	assumption	NOUN
bc386h4755t	10	13	that	that	SCONJ
bc386h4755t	10	14	the	the	DET
bc386h4755t	10	15	hzo	hzo	PROPN
bc386h4755t	10	16	electric	electric	PROPN
bc386h4755t	10	17	field	field	PROPN
bc386h4755t	10	18	controls	control	VERB
bc386h4755t	10	19	the	the	DET
bc386h4755t	10	20	capacitor	capacitor	NOUN
bc386h4755t	10	21	current	current	ADJ
bc386h4755t	10	22	direction	direction	NOUN
bc386h4755t	10	23	,	,	PUNCT
bc386h4755t	10	24	and	and	CCONJ
bc386h4755t	10	25	that	that	SCONJ
bc386h4755t	10	26	a	a	DET
bc386h4755t	10	27	flat	flat	ADJ
bc386h4755t	10	28	band	band	NOUN
bc386h4755t	10	29	condition	condition	NOUN
bc386h4755t	10	30	exists	exist	VERB
bc386h4755t	10	31	in	in	ADP
bc386h4755t	10	32	hzo	hzo	PROPN
bc386h4755t	10	33	at	at	ADP
bc386h4755t	10	34	the	the	DET
bc386h4755t	10	35	zero	zero	NUM
bc386h4755t	10	36	crossing	cross	VERB
bc386h4755t	10	37	voltages.a	voltages.a	PROPN
bc386h4755t	10	38	spectroscopic	spectroscopic	ADJ
bc386h4755t	10	39	photoresponse	photoresponse	NOUN
bc386h4755t	10	40	measurement	measurement	NOUN
bc386h4755t	10	41	system	system	NOUN
bc386h4755t	10	42	was	be	AUX
bc386h4755t	10	43	constructed	construct	VERB
bc386h4755t	10	44	,	,	PUNCT
bc386h4755t	10	45	capable	capable	ADJ
bc386h4755t	10	46	of	of	ADP
bc386h4755t	10	47	measuring	measure	VERB
bc386h4755t	10	48	electrical	electrical	ADJ
bc386h4755t	10	49	responses	response	NOUN
bc386h4755t	10	50	to	to	ADP
bc386h4755t	10	51	photons	photon	NOUN
bc386h4755t	10	52	ranging	range	VERB
bc386h4755t	10	53	in	in	ADP
bc386h4755t	10	54	energy	energy	NOUN
bc386h4755t	10	55	from	from	ADP
bc386h4755t	10	56	0.6	0.6	NUM
bc386h4755t	10	57	7	7	NUM
bc386h4755t	10	58	ev	ev	ADV
bc386h4755t	10	59	,	,	PUNCT
bc386h4755t	10	60	to	to	PART
bc386h4755t	10	61	measure	measure	VERB
bc386h4755t	10	62	polarization	polarization	NOUN
bc386h4755t	10	63	dependent	dependent	ADJ
bc386h4755t	10	64	band	band	NOUN
bc386h4755t	10	65	offsets	offset	NOUN
bc386h4755t	10	66	of	of	ADP
bc386h4755t	10	67	metal	metal	NOUN
bc386h4755t	10	68	-	-	PUNCT
bc386h4755t	10	69	fe	fe	NOUN
bc386h4755t	10	70	-	-	PUNCT
bc386h4755t	10	71	semiconductor	semiconductor	NOUN
bc386h4755t	10	72	capacitors	capacitor	NOUN
bc386h4755t	10	73	by	by	ADP
bc386h4755t	10	74	internal	internal	ADJ
bc386h4755t	10	75	photoemission	photoemission	NOUN
bc386h4755t	10	76	(	(	PUNCT
bc386h4755t	10	77	ipe	ipe	NOUN
bc386h4755t	10	78	)	)	PUNCT
bc386h4755t	10	79	.	.	PUNCT
bc386h4755t	11	1	the	the	DET
bc386h4755t	11	2	bandgap	bandgap	NOUN
bc386h4755t	11	3	of	of	ADP
bc386h4755t	11	4	hzo	hzo	PROPN
bc386h4755t	11	5	was	be	AUX
bc386h4755t	11	6	extracted	extract	VERB
bc386h4755t	11	7	as	as	ADP
bc386h4755t	11	8	6.2	6.2	NUM
bc386h4755t	11	9	+	+	NOUN
bc386h4755t	11	10	/0.2	/0.2	NOUN
bc386h4755t	11	11	ev	ev	NOUN
bc386h4755t	11	12	from	from	ADP
bc386h4755t	11	13	pd	pd	PROPN
bc386h4755t	11	14	/	/	SYM
bc386h4755t	11	15	hzo	hzo	PROPN
bc386h4755t	11	16	ipe	ipe	NOUN
bc386h4755t	11	17	transitions	transition	NOUN
bc386h4755t	11	18	.	.	PUNCT