id	author	title	date	pages	extension	mime	words	sentence	flesch	summary	cache	txt
47429882q9m	Aaron Michael Stuckey	X-Ray Studies of Mn Doped Iii-V Materials	2005		.txt	text/plain	362	16	52	X-ray reflectivity was used to characterize the structure of InMnAs heterostructures and InAlP oxide films. This improvement can then be used to improve the growth parameters in order to create materials upon which device development may be undertaken.	cache/47429882q9m.txt	txt/47429882q9m.txt