id	author	title	date	pages	extension	mime	words	sentences	flesch	summary	cache	txt
cord-023442-4vzwc2d2	nan	Proceedings of SCANNING 94/SEEMS 94 Charleston, South Carolina, USA	2006-12-05		.txt	text/plain	55552	2821	48	IV-4 Scanning Vol. 16, Supplement IV (1994) Simulation of image formation and detection systems in the SEM is a vital link in performing image analysis to obtain precise measurements, to provide the necessary connection between image parameters and structural dimensions, and to reflect important microscope beam and detector parameters. By knowing the transfer function, noise, and distortion figure in digital form, it is relatively easy to obtain more accurate comparison of the measured and calculated signal (Fig. 1 The calculation of image contrast in the scanning electron microscope (SEM) can be done using Monte Carlo techniques if the electron trajectories can be calculated through the composition profiles in the specimen. Specimens providing IV-18 Scanning Vol. 16, Supplement IV (1994) FIG highly redundant structures and relatively smooth fractures, such as cell suspensions or o/w emulsions, were investigated using freeze fracture/replication and ambient temperature transmission electron microscopy (AT-TEM).	./cache/cord-023442-4vzwc2d2.txt	./txt/cord-023442-4vzwc2d2.txt